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Thickness Measurements Using Photonic Modes in Monochromated Electron Energy-Loss Spectroscopy
Yurtsever, Aycan, Couillard, Martin, Hyun, Jerome K., Muller, David A.Volume:
20
Langue:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614000245
Date:
June, 2014
Fichier:
PDF, 877 KB
english, 2014