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[IEEE 2009 IEEE International Symposium on Electromagnetic Compatibility - EMC 2009 - Austin, TX, USA (2009.08.17-2009.08.21)] 2009 IEEE International Symposium on Electromagnetic Compatibility - Analysis of the propagation of electromagnetic disturbances inside integrated circuits using direct power injection and near-field scanning
Alaeldine, Ali, Bouchelouk, Lakhdar, Perdriau, Richard, Ramdani, MohamedAnnée:
2009
Langue:
english
DOI:
10.1109/isemc.2009.5284599
Fichier:
PDF, 944 KB
english, 2009