Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2014 / 09 Vol. 32; Iss. 5
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Spatial location of the Ec-0.6 eV electron trap in AlGaN/GaN heterojunctions
Lee, In-Hwan, Polyakov, Alexander Y., Smirnov, Nikolai B., Hahn, Cheol-Koo, Pearton, S. J.Volume:
32
Langue:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4895840
Date:
September, 2014
Fichier:
PDF, 562 KB
english, 2014