Thickness Dependence of Microstructure in Semiconducting Films of an Oligofluorene Derivative
DeLongchamp, Dean M., Ling, Mang Mang, Jung, Youngsuk, Fischer, Daniel A., Roberts, Mark E., Lin, Eric K., Bao, ZhenanVolume:
128
Langue:
english
Journal:
Journal of the American Chemical Society
DOI:
10.1021/ja064384q
Date:
December, 2006
Fichier:
PDF, 1.47 MB
english, 2006