Element Specific Monolayer Depth Profiling
Macke, Sebastian, Radi, Abdullah, Hamann-Borrero, Jorge E., Verna, Adriano, Bluschke, Martin, Brück, Sebastian, Goering, Eberhard, Sutarto, Ronny, He, Feizhou, Cristiani, Georg, Wu, Meng, Benckiser, EVolume:
26
Langue:
english
Journal:
Advanced Materials
DOI:
10.1002/adma.201402028
Date:
October, 2014
Fichier:
PDF, 805 KB
english, 2014