[IEEE 2014 IEEE 21st International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Marina Bay Sands, Singapore (2014.6.30-2014.7.4)] Proceedings of the 21th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Study of (correlated) trap sites in SILC, BTI and RTN in SiON and HKMG devices
Bury, Erik, Degraeve, Robin, Cho, Moon Ju, Kaczer, Ben, Goes, Wolfgang, Grasser, Tibor, Horiguchi, Naoto, Groeseneken, GuidoAnnée:
2014
Langue:
english
DOI:
10.1109/IPFA.2014.6898196
Fichier:
PDF, 3.96 MB
english, 2014
File converter
Plus de résultats de recherche
More benefits 
