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[IEEE 2007 IEEE International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (2007.05.30-2007.06.1)] 2007 IEEE International Conference on Integrated Circuit Design and Technology - Soft Error Considerations for Multicore Microprocessor Design
Robinson, William H., Alles, Michael L., Bapty, Theodore A., Bhuva, Bharat L., Black, Jeffrey D., Bonds, Alfred B., Massengill, Lloyd W., Neema, Sandeep K., Schrimpf, Ronald D., Scott, Jason M.Année:
2007
Langue:
english
DOI:
10.1109/ICICDT.2007.4299574
Fichier:
PDF, 1.62 MB
english, 2007