
[IEEE 2014 IEEE Electrical Insulation Conference (EIC) - Philadelphia, PA, USA (2014.6.8-2014.6.11)] 2014 IEEE Electrical Insulation Conference (EIC) - SF6 contaminated by SO2: Dielectric strength and influence on sealing materials
Wilhelm, Helena M., Mattoso, Mauricio, Gomez, Neffer A. G., Fernandes, Paulo O., Feitosa, Leandro, Cruz, Vanderlei, Meyer, Luiz H.Année:
2014
Langue:
english
DOI:
10.1109/EIC.2014.6869434
Fichier:
PDF, 815 KB
english, 2014