
Evaluation of Residual Stress in Thin Ferroelectric Films Using Grazing Incident X-Ray Diffraction
PETROV, Peter KR., SARMA, KUMARAVINOTHAN, ALFORD, NEIL MCN.Volume:
63
Langue:
english
Journal:
Integrated Ferroelectrics
DOI:
10.1080/10584580490459431
Date:
January, 2004
Fichier:
PDF, 120 KB
english, 2004