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[IEEE 2008 Global Symposium on Millimeter Waves (GSMM 2008) - Nanjing, China (2008.04.21-2008.04.24)] 2008 Global Symposium on Millimeter Waves - Wet Chemical MESA Etching Using HCl-based and FeCl3 Light Sensitive Etchants for InP Gunn Diodes
Lee, Seong-Dae, Lee, Jae-Seo, Kwak, No-Sung, Kim, Mi-Ra, Kim, Sam-Dong, Rhee, Jin-KooAnnée:
2008
Langue:
english
DOI:
10.1109/GSMM.2008.4534545
Fichier:
PDF, 1.50 MB
english, 2008