
[IEEE 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Hong Kong, China (2008.01.23-2008.01.25)] 4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008) - Design of a Low-Voltage CMOS Charge Pump
Cheng, Chun Yu, Leung, Ka Nang, Sun, Yi Ki, Or, Pui YingAnnée:
2008
Langue:
english
DOI:
10.1109/DELTA.2008.48
Fichier:
PDF, 705 KB
english, 2008