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Interface sulfur passivation using H2S annealing for atomic-layer-deposited Al2O3 films on an ultrathin-body In0.53Ga0.47As-on-insulator
Jin, Hyun Soo, Cho, Young Jin, Lee, Sang-Moon, Kim, Dae Hyun, Kim, Dae Woong, Lee, Dongsoo, Park, Jong-Bong, Won, Jeong Yeon, Lee, Myoung-Jae, Cho, Seong-Ho, Hwang, Cheol Seong, Park, Tae JooVolume:
315
Langue:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2014.07.123
Date:
October, 2014
Fichier:
PDF, 2.50 MB
english, 2014