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Microdose Induced Drain Leakage Effects in Power Trench MOSFETs: Experiment and Modeling
Zebrev, Gennady I., Vatuev, Alexander S., Useinov, Rustem G., Emeliyanov, Vladimir V., Anashin, Vasily S., Gorbunov, Maxim S., Turin, Valentin O., Yesenkov, Kirill A.Volume:
61
Langue:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2014.2315852
Date:
August, 2014
Fichier:
PDF, 1.22 MB
english, 2014