
[IEEE 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - Tempe, AZ, USA (2012.10.21-2012.10.24)] 2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems - Novel crosstalk modeling for multiple through-silicon-vias (TSV) on 3-D IC: Experimental validation and application to Faraday cage design
Chang, Yu-Jen, Chuang, Hao-Hsiang, Lu, Yi-Chang, Chiou, Yih-Peng, Wu, Tzong-Lin, Chen, Peng-Shu, Wu, Shih-Hsien, Kuo, Tzu-Ying, Zhan, Chau-Jie, Lo, Wei-ChungAnnée:
2012
Langue:
english
DOI:
10.1109/EPEPS.2012.6457884
Fichier:
PDF, 711 KB
english, 2012