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Structural determination of crystalline silicon by extended energy-loss fine-structure spectroscopy
De Crescenzi, M., Lozzi, L., Picozzi, P., Santucci, S., Benfatto, M., Natoli, C. R.Volume:
39
Langue:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.39.8409
Date:
April, 1989
Fichier:
PDF, 722 KB
english, 1989