Modeling of Parasitic Fringing Capacitance in Multifin Trigate FinFETs
Lee, KwangWon, An, TaeYoon, Joo, SoYeon, Kwon, Kee-Won, Kim, SoYoungVolume:
60
Langue:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2013.2252467
Date:
May, 2013
Fichier:
PDF, 756 KB
english, 2013