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Sampling depth of total electron and fluorescence measurements in Si L- and K-edge absorption spectroscopy
M. Kasrai, W.N. Lennard, R.W. Brunner, G.M. Bancroft, J.A. Bardwell, K.H. TanVolume:
99
Année:
1996
Langue:
english
Pages:
10
DOI:
10.1016/0169-4332(96)00454-0
Fichier:
PDF, 909 KB
english, 1996