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In situ X-ray reflectivity measurement of thin film growth during vacuum deposition
Chih-Hao Lee, Sung-Yuh TsengVolume:
92
Année:
1996
Langue:
english
Pages:
5
DOI:
10.1016/0169-4332(95)00242-1
Fichier:
PDF, 281 KB
english, 1996