Photoreflectance of strained Si1-xGex epilayers (0.07≤x≥0.26) and comparison with spectroscopic ellipsometry
R.T. Carline, C. Pickering, T.J.C. Hosea, D.J. RobbinsVolume:
81
Année:
1994
Langue:
english
Pages:
9
DOI:
10.1016/0169-4332(94)90053-1
Fichier:
PDF, 653 KB
english, 1994