Charge-discharge dynamics of disorder induced gap state continuum at compound semiconductor-insulator interfaces
Li He, Hideki Hasegawa, Ji-kui Luo, Hideo OhnoVolume:
33-34
Année:
1988
Langue:
english
Pages:
7
DOI:
10.1016/0169-4332(88)90412-6
Fichier:
PDF, 295 KB
english, 1988