Grain Orientation Mapping of Polycrystalline Organic Semiconductor Films by Transverse Shear Microscopy
Vivek Kalihari, E. B. Tadmor, Greg Haugstad, C. Daniel FrisbieVolume:
20
Année:
2008
Langue:
english
Pages:
7
DOI:
10.1002/adma.200801834
Fichier:
PDF, 699 KB
english, 2008