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Modelling of pattern growth by vacancy diffusion and trapping on Si(111) 7×7 surface
M.A. Kulakov, St. Werdin, P. Heuell, B. BullemerVolume:
287-288
Année:
1993
Langue:
english
Pages:
1
DOI:
10.1016/0167-2584(93)90427-k
Fichier:
PDF, 69 KB
english, 1993