Noninvasive Semiconductor Field Imaging: Imaging the Electric-Field Distribution in Organic Devices by Confocal Electroreflectance Microscopy (Adv. Funct. Mater. 8/2009)
Michele Celebrano, Calogero Sciascia, Giulio Cerullo, Margherita Zavelani-Rossi, Guglielmo Lanzani, Juan Cabanillas-GonzalezVolume:
19
Année:
2009
Pages:
1
DOI:
10.1002/adfm.200990028
Fichier:
PDF, 275 KB
2009