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An in Situ Study of Mesostructured CTAB−Silica Film Formation during Dip Coating Using Time-Resolved SAXS and Interferometry Measurements
Grosso, David, Babonneau, Florence, Albouy, Pierre-Antoine, Amenitsch, Heinz, Balkenende, A. R., Brunet-Bruneau, Aline, Rivory, JosetteVolume:
14
Langue:
english
Journal:
Chemistry of Materials
DOI:
10.1021/cm011255u
Date:
February, 2002
Fichier:
PDF, 220 KB
english, 2002