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Effect of Conductance Variability on Resistor-Logic Demultiplexers for Nanoelectronics
P. Kuekes, W. Robinett, R. WilliamsVolume:
5
Année:
2006
Langue:
english
DOI:
10.1109/TNANO.2006.880405
Fichier:
PDF, 666 KB
english, 2006