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Surface characterization study of InP(100) substrates using ion-scattering spectroscopy, Auger electron spectroscopy and electron spectroscopy for chemical analysis I: Comparison of substrate-cleaning techniques
Stuart J. Hoekje, Gar B. HoflundVolume:
197
Année:
1991
Langue:
english
Pages:
14
DOI:
10.1016/0040-6090(91)90247-u
Fichier:
PDF, 859 KB
english, 1991