Ellipsometric and X-ray specular reflection studies on naturally grown overlayers on aluminium thin films
P.B. Barna, Z. Bodó, G. Gergely, P. Croce, J. Ádám, P. JakabVolume:
120
Année:
1984
Langue:
english
Pages:
8
DOI:
10.1016/0040-6090(84)90239-6
Fichier:
PDF, 552 KB
english, 1984