
Temperature and thickness dependence of the Ohmic and thermoelectric behaviour of Cu-Ni thin films of constantan type obtained by controlled UHV co-evaporation
G Richon, J Gouault, J.J HerouVolume:
36
Année:
1976
Langue:
english
Pages:
5
DOI:
10.1016/0040-6090(76)90398-9
Fichier:
PDF, 211 KB
english, 1976