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A method for fitting the Fuchs-Sondheimer theory to resistivity-thickness measurements for all film thicknesses
G.N. Gould, L.A. MoragaVolume:
10
Année:
1972
Langue:
english
Pages:
4
DOI:
10.1016/0040-6090(72)90202-7
Fichier:
PDF, 212 KB
english, 1972