Soft X-ray photoelectron microscopy used for the characterization of diamond, a-C and CNx, thin films
Ziethen, Ch., Wegelin, F., Schönhense, G., Ohr, R., Neuhäuser, M., Hilgers, H.Volume:
11
Langue:
english
Journal:
Diamond and Related Materials
DOI:
10.1016/S0925-9635(01)00597-0
Date:
March, 2002
Fichier:
PDF, 886 KB
english, 2002