Generation and annealing of interface traps on oxidized silicon irradiated by keV electrons
Wallace Wan-Li Lin, Chih-Tang SahVolume:
31
Année:
1988
Langue:
english
Pages:
9
DOI:
10.1016/0038-1101(88)90112-8
Fichier:
PDF, 1002 KB
english, 1988