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Relationship between strained silicon-oxygen bonds and radiation induced paramagnetic point defects in silicon dioxide
W.L. Warren, P.M. Lenahan, C.J. BrinkerVolume:
79
Année:
1991
Langue:
english
Pages:
5
DOI:
10.1016/0038-1098(91)90077-9
Fichier:
PDF, 368 KB
english, 1991