XPS method as a useful tool for studies of quantum well epitaxial materials: Chemical composition and thermal stability of InGaN/GaN multilayers
Lisowski, Wojciech, Grzanka, Ewa, Sobczak, Janusz W., Krawczyk, Mirosław, Jablonski, Aleksander, Czernecki, Robert, Leszczyński, Michał, Suski, TadeuszVolume:
597
Langue:
english
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2014.02.007
Date:
June, 2014
Fichier:
PDF, 1.54 MB
english, 2014
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