Methodology for improvement of data retention in floating gate flash memory using leakage current estimation
Moon, Pyung, Lim, Jun Yeong, Youn, Tae-Un, Noh, Keum-Whan, Park, Sung-Kye, Yun, IlguVolume:
53
Langue:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.07.007
Date:
September, 2013
Fichier:
PDF, 1.06 MB
english, 2013