Compliance analysis of multi-path fan-shaped interconnects
Chen, Wei, Okereke, Raphael, Sitaraman, Suresh K.Volume:
53
Langue:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2013.04.007
Date:
July, 2013
Fichier:
PDF, 2.48 MB
english, 2013