The Stanford Nanocharacterization Laboratory (SNL) and Recent Applications of an Aberration-Corrected Environmental Transmission Electron Microscope
Zschech, Ehrenfried, Sinclair, Robert, Kempen, Paul Joseph, Chin, Richard, Koh, Ai LeenVolume:
16
Langue:
english
Journal:
Advanced Engineering Materials
DOI:
10.1002/adem.201400015
Date:
May, 2014
Fichier:
PDF, 982 KB
english, 2014