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Interpretations of the Critical Indentation Depths in Soft Coatings on Hard Substrates from a Morphological Analysis on Nanocontact Impressions
Lee, Yun-Hee, Kim, Yongil, Ryu, Kwon Sang, Nahm, Seung Hoon, Yoon, Ki-BongVolume:
50
Langue:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.50.01BJ04
Date:
January, 2011
Fichier:
PDF, 513 KB
english, 2011