[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Electromigration of Cu interconnects under AC, pulsed-DC and DC test conditions
Shaviv, Roey, Harm, Gregory J., Kumari, Sangita, Keller, Robert R., Read, David T.Année:
2011
Langue:
english
DOI:
10.1109/IRPS.2011.5784570
Fichier:
PDF, 534 KB
english, 2011