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More than a decade of the non-saturating autoclave as a highly accelerated stress technique for evaluating the reliability of nonhermetic microelectronic components
N. SinnaduraiVolume:
23
Année:
1983
Langue:
english
Pages:
4
DOI:
10.1016/0026-2714(83)91007-7
Fichier:
PDF, 531 KB
english, 1983