Study of the structural evolution in ZnO thin film by in situ synchrotron x-ray scattering
Hur, Tae-Bong, Hwang, Yoon-Hwae, Kim, Hyung-Kook, Park, Hong-LeeVolume:
96
Année:
2004
Langue:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.1762706
Fichier:
PDF, 524 KB
english, 2004