Robust Bayesian analysis of Weibull failure model
Chaturvedi, Anoop, Pati, Manaswini, Tomer, Sanjeev K.Volume:
72
Langue:
english
Journal:
METRON
DOI:
10.1007/s40300-013-0027-7
Date:
April, 2014
Fichier:
PDF, 256 KB
english, 2014