A broad and tunable 250- to 430-nm source for microscopy and lifetime measurements by frequency doubling of a 78-MHz-picosecond white-light laser
Bradler, Maximilian, Nielsen, Frederik D., Eckert, Carl Elias, Riedle, EberhardVolume:
116
Langue:
english
Journal:
Applied Physics B
DOI:
10.1007/s00340-014-5774-5
Date:
September, 2014
Fichier:
PDF, 1.13 MB
english, 2014