Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
2014 / 02 Vol. 8; Iss. 1
Light scattering in nanocrystalline silicon-carbide (nc-SiC) films
Semenov, A. V., Lopin, A. V., Puzikov, V. M., Mateichenko, P. V.Volume:
8
Langue:
english
Journal:
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques
DOI:
10.1134/S1027451014010388
Date:
February, 2014
Fichier:
PDF, 1.96 MB
english, 2014