SPIE Proceedings [SPIE Seventh International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 10 October 2008)] Seventh International Symposium on Instrumentation and Control Technology: Sensors and Instruments, Computer Simulation, and Artificial Intelligence - An electron analyzer
Zhang, Ai-Bing, Kong, Ling-Gao, Wang, Shi-Jin, Li, Lei, Zheng, Xiang-Zhi, Fang, Jiancheng, Wang, ZhongyuVolume:
7127
Année:
2008
Langue:
english
DOI:
10.1117/12.806346
Fichier:
PDF, 393 KB
english, 2008