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Extended linear polarimeter to measure retardance and flicker: application to liquid crystal on silicon devices in two working geometries
Martínez, Francisco J., Márquez, Andrés, Gallego, Sergi, Francés, Jorge, Pascual, InmaculadaVolume:
53
Langue:
english
Journal:
Optical Engineering
DOI:
10.1117/1.OE.53.1.014105
Date:
January, 2014
Fichier:
PDF, 2.19 MB
english, 2014