Accurate analysis of indium–zinc oxide thin films via laser-induced breakdown spectroscopy based on plasma modeling
Axente, Emanuel, Hermann, Jörg, Socol, Gabriel, Mercadier, Laurent, Beldjilali, Sid Ahmed, Cirisan, Mihaela, Luculescu, Catalin R., Ristoscu, Carmen, Mihailescu, Ion N., Craciun, ValentinVolume:
29
Année:
2014
Langue:
english
Journal:
Journal of Analytical Atomic Spectrometry
DOI:
10.1039/C3JA50355K
Fichier:
PDF, 1.21 MB
english, 2014