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[IEEE 2012 24th International Symposium on Power Semiconductor Devices & IC's (ISPSD) - Bruges, Belgium (2012.06.3-2012.06.7)] 2012 24th International Symposium on Power Semiconductor Devices and ICs - Study of electron and hole traps in freewheeling diodes for low loss and low reverse recovery surge voltage
Kameyama, Satoru, Hara, Masafumi, Kubo, Tomohiro, Hirahara, Fumio, Ebine, Junpei, Murakami, KoichiAnnée:
2012
Langue:
english
DOI:
10.1109/ISPSD.2012.6229098
Fichier:
PDF, 1.05 MB
english, 2012