SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 16 April 2012)] Optical Micro- and Nanometrology IV - Fiber-top and ferrule-top cantilevers for atomic force microscopy and scanning near field optical microscopy
Chavan, Dhwajal, Gruca, Grzegorz, van de Watering, Tomek, Heeck, Kier, Rector, Jan, Slaman, Martin, Andres, Dieter, Tiribilli, Bruno, Margheri, Giancarlo, Iannuzzi, Davide, Gorecki, Christophe, AsundiVolume:
8430
Année:
2012
Langue:
english
DOI:
10.1117/12.922117
Fichier:
PDF, 1.23 MB
english, 2012