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[IEEE 2006 IEEE International Symposium on Power Semiconductor Devices & IC's - Naples, Italy (04-08 June 2006)] 2006 IEEE International Symposium on Power Semiconductor Devices & IC's - Mechanical stress dependence of power device electrical characteristics
Tanaka, H., Hotta, K., Kuwano, S., Usui, M., Ishiko, M.Année:
2006
Langue:
english
DOI:
10.1109/ISPSD.2006.1666056
Fichier:
PDF, 4.37 MB
english, 2006