SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Photoluminescence investigation of InAs quantum dots in quantum well with different strain reducing layer
Kong, Lingmin, Zhou, Yunqing, Wang, Rui, Zhang, Cunxi, Yao, Jianming, Wang, Shilai, Cai, Jiafa, Wu, Zhengyun, Jiang, Ya-Dong, Kippelen, Bernard, Yu, JunshengVolume:
7658
Année:
2010
Langue:
english
DOI:
10.1117/12.864046
Fichier:
PDF, 236 KB
english, 2010
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